DataRay Scanning Slit Beam Profilers feature a silicon detector making it perfect for a 190 to 1150nm spectral range. Equipped with 2.5µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters down to 2µm. Scanning slit instruments offer much higher resolution than camera-based systems, and are compatible with both continuous wave and pulsed laser sources. DataRay Scanning Slit Beam Profilers are ideal for optical assembly and instrument alignment, real-time diagnosis of focusing and alignment errors, real-time setting of multiple assemblies to the same focus. These profilers are USB 2.0 powered and include a 3m USB 2.0 cable.
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